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"Experimental investigation on the evolution of a conducted-EMI buck ..."

Shawki Douzi, Mohamed Tlig, Jaleleddine Ben Hadj Slama (2015)

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DOI: 10.1016/J.MICROREL.2015.07.009

access: closed

type: Journal Article

metadata version: 2020-02-22

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Shawki Douzi, Mohamed Tlig, Jaleleddine Ben Hadj Slama:
Experimental investigation on the evolution of a conducted-EMI buck converter after thermal aging tests of the MOSFET. Microelectron. Reliab. 55(9-10): 1391-1394 (2015)

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