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"An athermal measurement technique for long time constants traps ..."

Alexis Divay et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.06.074

access: closed

type: Journal Article

metadata version: 2021-02-26

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Alexis Divay, Mohamed Masmoudi, Olivier Latry, Cedric Duperrier, Farid Temcamani:
An athermal measurement technique for long time constants traps characterization in GaN HEMT transistors. Microelectron. Reliab. 55(9-10): 1703-1707 (2015)

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