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"Experimental study on the influence of junction temperature on the ..."

Subhas Chandra Das, G. Narayanan, Arvind Tiwari (2018)

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DOI: 10.1016/J.MICROREL.2017.11.023

access: closed

type: Journal Article

metadata version: 2021-10-14

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Subhas Chandra Das, G. Narayanan, Arvind Tiwari:
Experimental study on the influence of junction temperature on the relationship between IGBT switching energy loss and device current. Microelectron. Reliab. 80: 134-143 (2018)

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