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"NBT stress-induced degradation and lifetime estimation in p-channel power ..."
Danijel Dankovic et al. (2006)
- Danijel Dankovic
, Ivica Manic, Snezana Djoric-Veljkovic
, Vojkan Davidovic
, Snezana Golubovic, Ninoslav Stojadinovic:
NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs. Microelectron. Reliab. 46(9-11): 1828-1833 (2006)

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