"NBT stress-induced degradation and lifetime estimation in p-channel power ..."

Danijel Dankovic et al. (2006)

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DOI: 10.1016/J.MICROREL.2006.07.077

access: closed

type: Journal Article

metadata version: 2024-02-05

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Danijel Dankovic, Ivica Manic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Snezana Golubovic, Ninoslav Stojadinovic:
NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs. Microelectron. Reliab. 46(9-11): 1828-1833 (2006)

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