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"Reliability of 100 nm AlGaN/GaN HEMTs for mm-wave applications."

Maximilian Dammann et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.07.008

access: closed

type: Journal Article

metadata version: 2021-10-14

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  - https://dblp.org/rec/journals/mr/DammannBPBKQMGS17
Maximilian Dammann, Martina Baeumler, Vladimir Polyakov, Peter Brückner, Helmer Konstanzer, Rüdiger Quay, Michael Mikulla, Andreas Graff, Michél Simon-Najasek:
Reliability of 100 nm AlGaN/GaN HEMTs for mm-wave applications. Microelectron. Reliab. 76-77: 292-297 (2017)

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