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"Reliability of ESD protection devices designed in a 3D technology."

Bertrand Courivaud et al. (2014)

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DOI: 10.1016/J.MICROREL.2014.07.136

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/CourivaudNFBC14
Bertrand Courivaud, Nicolas Nolhier, Gilles Ferru, Marise Bafleur, Fabrice Caignet:
Reliability of ESD protection devices designed in a 3D technology. Microelectron. Reliab. 54(9-10): 2272-2277 (2014)

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