Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Gate metal interdiffusion induced degradation in space-qualified GaAs PHEMTs."

Yeong-Chang Chou et al. (2006)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2005.02.012

access: closed

type: Journal Article

metadata version: 2022-07-20

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/ChouLGLKLEBO06
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/ChouLGLKLEBO06
Yeong-Chang Chou, Denise Leung, Ronald Grundbacher, Richard Lai, Quin Kan, P. H. Liu, David Eng, Thomas R. Block, Aaron K. Oki:
Gate metal interdiffusion induced degradation in space-qualified GaAs PHEMTs. Microelectron. Reliab. 46(1): 24-40 (2006)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.