![](https://dblp.uni-trier.de/img/logo.ua.320x120.png)
![](https://dblp.uni-trier.de/img/dropdown.dark.16x16.png)
![](https://dblp.uni-trier.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
![search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
default search action
"Gate metal interdiffusion induced degradation in space-qualified GaAs PHEMTs."
Yeong-Chang Chou et al. (2006)
- Yeong-Chang Chou, Denise Leung, Ronald Grundbacher, Richard Lai, Quin Kan, P. H. Liu, David Eng, Thomas R. Block, Aaron K. Oki:
Gate metal interdiffusion induced degradation in space-qualified GaAs PHEMTs. Microelectron. Reliab. 46(1): 24-40 (2006)
![](https://dblp.uni-trier.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.