"Nanowire width dependence of data retention and endurance characteristics ..."

Jin Hyung Choi, Chong-Gun Yu, Jong Tae Park (2016)

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DOI: 10.1016/J.MICROREL.2016.07.039

access: closed

type: Journal Article

metadata version: 2022-10-02

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Jin Hyung Choi, Chong-Gun Yu, Jong Tae Park:
Nanowire width dependence of data retention and endurance characteristics in nanowire SONOS flash memory. Microelectron. Reliab. 64: 215-219 (2016)

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