"Wire width dependence of hot carrier degradation in silicon nanowire ..."

Jin Hyung Choi, Jong Tae Park (2015)

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DOI: 10.1016/J.MICROREL.2015.06.127

access: closed

type: Journal Article

metadata version: 2022-04-22

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Jin Hyung Choi, Jong Tae Park:
Wire width dependence of hot carrier degradation in silicon nanowire gate-all-around MOSFETs. Microelectron. Reliab. 55(9-10): 1438-1441 (2015)

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