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"Effects of channel thickness variation on bias stress instability of ..."

Edward Namkyu Cho, Jung Han Kang, Ilgu Yun (2011)

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DOI: 10.1016/J.MICROREL.2011.07.018

access: closed

type: Journal Article

metadata version: 2020-02-22

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Edward Namkyu Cho, Jung Han Kang, Ilgu Yun:
Effects of channel thickness variation on bias stress instability of InGaZnO thin-film transistors. Microelectron. Reliab. 51(9-11): 1792-1795 (2011)

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