"Field plate related reliability improvements in GaN-on-Si HEMTs."

Alessandro Chini et al. (2012)

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DOI: 10.1016/J.MICROREL.2012.06.040

access: closed

type: Journal Article

metadata version: 2024-05-07

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Alessandro Chini, Fabio Soci, Fausto Fantini, Antonio Nanni, Alessio Pantellini, Claudio Lanzieri, Davide Bisi, Gaudenzio Meneghesso, Enrico Zanoni:
Field plate related reliability improvements in GaN-on-Si HEMTs. Microelectron. Reliab. 52(9-10): 2153-2158 (2012)

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