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"Percolation theory applied to PZT thin films capacitors breakdown mechanisms."

Mohamed-Tahar Chentir et al. (2009)

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DOI: 10.1016/J.MICROREL.2009.07.048

access: closed

type: Journal Article

metadata version: 2022-03-12

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Mohamed-Tahar Chentir, J.-B. Jullien, B. Valtchanov, Emilien Bouyssou, Laurent Ventura, Christine Anceau:
Percolation theory applied to PZT thin films capacitors breakdown mechanisms. Microelectron. Reliab. 49(9-11): 1074-1078 (2009)

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