"Degradation behavior of high power light emitting diode under high ..."

Sihan Chen et al. (2012)

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DOI: 10.1016/J.MICROREL.2012.06.069

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type: Journal Article

metadata version: 2022-02-04

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Sihan Chen, Cher Ming Tan, Guan Hong Tan, Feifei He:
Degradation behavior of high power light emitting diode under high frequency switching. Microelectron. Reliab. 52(9-10): 2168-2173 (2012)

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