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"Study of short-circuit robustness of SiC MOSFETs, analysis of the failure ..."
Cheng Chen et al. (2015)
- Cheng Chen, Denis Labrousse, Stéphane Lefebvre, Mickael Petit
, Cyril Buttay
, Hervé Morel:
Study of short-circuit robustness of SiC MOSFETs, analysis of the failure modes and comparison with BJTs. Microelectron. Reliab. 55(9-10): 1708-1713 (2015)
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