"Radiation hardened by design techniques to reduce single event transient ..."

Jianjun Chen et al. (2012)

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DOI: 10.1016/J.MICROREL.2011.12.002

access: closed

type: Journal Article

metadata version: 2023-09-30

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Jianjun Chen, Shuming Chen, Bin Liang, Biwei Liu, Fanyu Liu:
Radiation hardened by design techniques to reduce single event transient pulse width based on the physical mechanism. Microelectron. Reliab. 52(6): 1227-1232 (2012)

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