"Backend dielectric reliability simulator for microprocessor system."

Chang-Chih Chen et al. (2012)

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DOI: 10.1016/J.MICROREL.2012.07.002

access: closed

type: Journal Article

metadata version: 2022-10-02

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Chang-Chih Chen, Fahad Ahmed, Dae Hyun Kim, Sung Kyu Lim, Linda Milor:
Backend dielectric reliability simulator for microprocessor system. Microelectron. Reliab. 52(9-10): 1953-1959 (2012)

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