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"Interface traps effect on the charge transport mechanisms in metal oxide ..."

S. Chatbouri et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.09.010

access: closed

type: Journal Article

metadata version: 2020-10-26

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S. Chatbouri, M. Troudi, A. Kalboussi, A. Souifi:
Interface traps effect on the charge transport mechanisms in metal oxide semiconductor structures based on silicon nanocrystals. Microelectron. Reliab. 78: 227-232 (2017)

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