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"Remote carrier trapping in FinFETs with ONO buried layer: Temperature effects."
Sung-Jae Chang et al. (2013)
- Sung-Jae Chang, Maryline Bawedin, Wade Xiong, Jong-Hyun Lee, Jung-Hee Lee, Sorin Cristoloveanu:
Remote carrier trapping in FinFETs with ONO buried layer: Temperature effects. Microelectron. Reliab. 53(3): 386-393 (2013)
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