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"The die-to-die calibrated combined model of negative bias temperature ..."
Soonyoung Cha et al. (2015)
- Soonyoung Cha
, Dae Hyun Kim
, Taizhi Liu, Linda S. Milor
:
The die-to-die calibrated combined model of negative bias temperature instability and gate oxide breakdown from device to system. Microelectron. Reliab. 55(9-10): 1404-1411 (2015)
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