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"Reliability predictions in electronic industrial applications."

G. Cassanelli et al. (2005)

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DOI: 10.1016/J.MICROREL.2005.07.014

access: closed

type: Journal Article

metadata version: 2023-03-21

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G. Cassanelli, Giovanna Mura, F. Cesaretti, Massimo Vanzi, Fausto Fantini:
Reliability predictions in electronic industrial applications. Microelectron. Reliab. 45(9-11): 1321-1326 (2005)

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