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"Simulation of failure time distributions of metal lines under ..."
M. R. Carriero, Stefano Di Pascoli, Giuseppe Iannaccone (2002)
- M. R. Carriero, Stefano Di Pascoli, Giuseppe Iannaccone:
Simulation of failure time distributions of metal lines under electromigration. Microelectron. Reliab. 42(9-11): 1469-1472 (2002)
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