"On-chip measurement to analyze failure mechanisms of ICs under system ..."

Fabrice Caignet et al. (2013)

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DOI: 10.1016/J.MICROREL.2013.07.056

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type: Journal Article

metadata version: 2020-02-22

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Fabrice Caignet, Nicolas Nolhier, Marise Bafleur, A. Wang, Nicolas Mauran:
On-chip measurement to analyze failure mechanisms of ICs under system level ESD stress. Microelectron. Reliab. 53(9-11): 1278-1283 (2013)

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