"Transient interferometric mapping of smart power SOI ESD protection ..."

Sergey Bychikhin et al. (2004)

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DOI: 10.1016/J.MICROREL.2004.07.110

access: closed

type: Journal Article

metadata version: 2022-03-16

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Sergey Bychikhin, Viktor Dubec, Dionyz Pogany, Erich Gornik, M. Graf, V. Dudek, Winfried Soppa:
Transient interferometric mapping of smart power SOI ESD protection devices under TLP and vf-TLP stress. Microelectron. Reliab. 44(9-11): 1687-1692 (2004)

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