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"Investigations of impact ionization phenomena in advanced transistors and ..."
Alexander N. Bubennikov, Andrey V. Zykov (2001)
- Alexander N. Bubennikov, Andrey V. Zykov:
Investigations of impact ionization phenomena in advanced transistors and speed-power improvement of BiMOS SRAM cells based on reverse base current effect. Microelectron. Reliab. 41(2): 219-228 (2001)
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