BibTeX record journals/mr/BreglioINRSHNU08

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@article{DBLP:journals/mr/BreglioINRSHNU08,
  author    = {Giovanni Breglio and
               Andrea Irace and
               E. Napoli and
               Michele Riccio and
               Paolo Spirito and
               K. Hamada and
               T. Nishijima and
               T. Ueta},
  title     = {Detection of localized {UIS} failure on IGBTs with the aid of lock-in
               thermography},
  journal   = {Microelectron. Reliab.},
  volume    = {48},
  number    = {8-9},
  pages     = {1432--1434},
  year      = {2008},
  url       = {https://doi.org/10.1016/j.microrel.2008.06.042},
  doi       = {10.1016/j.microrel.2008.06.042},
  timestamp = {Sat, 22 Feb 2020 19:28:15 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/BreglioINRSHNU08.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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