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"Investigations on double-diffused MOS transistors under ESD zap conditions."

Gianluca Boselli et al. (2001)

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DOI: 10.1016/S0026-2714(00)00240-7

access: closed

type: Journal Article

metadata version: 2023-09-30

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Gianluca Boselli, Stan Meeuwsen, Ton J. Mouthaan, Fred G. Kuper:
Investigations on double-diffused MOS transistors under ESD zap conditions. Microelectron. Reliab. 41(3): 395-405 (2001)

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