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"Probabilistic analysis of CMOS physical defects in VLSI circuits for test ..."

Mykola Blyzniuk et al. (2001)

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DOI: 10.1016/S0026-2714(01)00092-0

access: closed

type: Journal Article

metadata version: 2020-10-26

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  - https://dblp.org/rec/journals/mr/BlyzniukKKPRU01
Mykola Blyzniuk, Irena Kazymyra, Wieslaw Kuzmicz, Witold A. Pleskacz, Jaan Raik, Raimund Ubar:
Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvement. Microelectron. Reliab. 41(12): 2023-2040 (2001)

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