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"Single-parameter model for the post-breakdown conduction characteristics ..."
Juli Blasco et al. (2014)
- Juli Blasco, Helena Castán, Héctor García, Salvador Dueñas, Jordi Suñé, Marianna Kemell, Kaupo Kukli, Mikko Ritala, Markku Leskelä, Enrique Miranda:
Single-parameter model for the post-breakdown conduction characteristics of HoTiOx-based MIM capacitors. Microelectron. Reliab. 54(9-10): 1707-1711 (2014)
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