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"MTF test system with AC based dynamic joule correction for ..."

Leen Biesemans et al. (2004)

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DOI: 10.1016/J.MICROREL.2004.07.096

access: closed

type: Journal Article

metadata version: 2023-09-30

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Leen Biesemans, K. Schepers, Kris Vanstreels, Jan D'Haen, Ward De Ceuninck, Marc D'Olieslaeger:
MTF test system with AC based dynamic joule correction for electromigration tests on interconnects. Microelectron. Reliab. 44(9-11): 1849-1854 (2004)

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