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"Characterization of the self-heating of AlGaN/GaN HEMTs during an ..."

Fanny Berthet et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.07.022

access: closed

type: Journal Article

metadata version: 2023-10-03

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Fanny Berthet, Yannick Guhel, Hamid Gualous, Bertrand Boudart, Jean-Lionel Trolet, Marc Piccione, Christophe Gaquière:
Characterization of the self-heating of AlGaN/GaN HEMTs during an electrical stress by using Raman spectroscopy. Microelectron. Reliab. 51(9-11): 1796-1800 (2011)

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