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"Impact of interface state trap density on the performance characteristics ..."
Brahim Benbakhti et al. (2010)
- Brahim Benbakhti, J. S. Ayubi-Moak, Karol Kalna
, D. Lin, Geert Hellings, Guy Brammertz
, Kristin De Meyer, Iain Thayne, Asen Asenov:
Impact of interface state trap density on the performance characteristics of different III-V MOSFET architectures. Microelectron. Reliab. 50(3): 360-364 (2010)
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