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"Comparative analysis of accelerated ageing effects on power RF LDMOS ..."

Mohamed Ali Belaïd et al. (2005)

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DOI: 10.1016/J.MICROREL.2005.07.099

access: closed

type: Journal Article

metadata version: 2022-10-02

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Mohamed Ali Belaïd, K. Ketata, Karine Mourgues, Hichame Maanane, Mohamed Masmoudi, Jérôme Marcon:
Comparative analysis of accelerated ageing effects on power RF LDMOS reliability. Microelectron. Reliab. 45(9-11): 1732-1737 (2005)

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