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"Evaluation of hot-electron effects on critical parameter drifts in power ..."

Mohamed Ali Belaïd, K. Daoud (2010)

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DOI: 10.1016/J.MICROREL.2010.07.070

access: closed

type: Journal Article

metadata version: 2022-10-02

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Mohamed Ali Belaïd, K. Daoud:
Evaluation of hot-electron effects on critical parameter drifts in power RF LDMOS transistors. Microelectron. Reliab. 50(9-11): 1763-1767 (2010)

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