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"Performance analysis of S-parameter in N-MOSFET devices after thermal ..."

Mohamed Ali Belaïd (2018)

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DOI: 10.1016/J.MICROREL.2018.07.133

access: closed

type: Journal Article

metadata version: 2022-10-02

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Mohamed Ali Belaïd:
Performance analysis of S-parameter in N-MOSFET devices after thermal accelerated tests. Microelectron. Reliab. 91: 8-14 (2018)

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