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"Impact of hot carrier injection on switching time evolution for power RF ..."

Mohamed Ali Belaïd (2015)

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DOI: 10.1016/J.MICROREL.2015.07.002

access: closed

type: Journal Article

metadata version: 2022-10-02

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Mohamed Ali Belaïd:
Impact of hot carrier injection on switching time evolution for power RF LDMOS after accelerated tests. Microelectron. Reliab. 55(9-10): 2041-2044 (2015)

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