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"Neutron-induced 10B fission as a major source of soft errors in ..."

Robert C. Baumann, Eric B. Smith (2001)

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DOI: 10.1016/S0026-2714(00)00218-3

access: closed

type: Journal Article

metadata version: 2020-02-22

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Robert C. Baumann, Eric B. Smith:
Neutron-induced ¹⁰B fission as a major source of soft errors in high density SRAMs. Microelectron. Reliab. 41(2): 211-218 (2001)

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