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"Study of gate leakage mechanism in advanced charge-coupled MOSFET ..."
Giacomo Barletta, V. C. Ngwan (2016)
- Giacomo Barletta, V. C. Ngwan:
Study of gate leakage mechanism in advanced charge-coupled MOSFET (CC-MOSFET) technology. Microelectron. Reliab. 57: 20-23 (2016)
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