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"Delay fault testing using partial multiple scan chains."

Eduardas Bareisa et al. (2013)

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DOI: 10.1016/J.MICROREL.2013.07.002

access: closed

type: Journal Article

metadata version: 2023-03-21

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Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas:
Delay fault testing using partial multiple scan chains. Microelectron. Reliab. 53(12): 2070-2077 (2013)

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