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"Empirical BEOL-TDDB evaluation based on I(t)-trace analysis."

Oliver Aubel et al. (2014)

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DOI: 10.1016/J.MICROREL.2014.07.127

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/AubelBTG14
Oliver Aubel, Armand Beyer, Georg Talut, Martin Gall:
Empirical BEOL-TDDB evaluation based on I(t)-trace analysis. Microelectron. Reliab. 54(9-10): 1671-1674 (2014)

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