"Pseudomorphic high electron mobility transistor monolithic microwave ..."

Wallace T. Anderson et al. (2001)

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DOI: 10.1016/S0026-2714(01)00082-8

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type: Journal Article

metadata version: 2020-02-22

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Wallace T. Anderson, Jason A. Roussos, Jeffrey A. Mittereder, Dimitrios E. Ioannou, C. Moglestue:
Pseudomorphic high electron mobility transistor monolithic microwave integrated circuits reliability study. Microelectron. Reliab. 41(8): 1109-1113 (2001)

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