BibTeX record journals/mr/AlwanBKZ07

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@article{DBLP:journals/mr/AlwanBKZ07,
  author    = {M. Alwan and
               B. Beydoun and
               K. Ketata and
               M. Zoaeter},
  title     = {Gate charge behaviors in N-channel power VDMOSFETs during {HEF} and
               {PBT} stresses},
  journal   = {Microelectron. Reliab.},
  volume    = {47},
  number    = {9-11},
  pages     = {1406--1410},
  year      = {2007},
  url       = {https://doi.org/10.1016/j.microrel.2007.07.096},
  doi       = {10.1016/j.microrel.2007.07.096},
  timestamp = {Sat, 22 Feb 2020 19:26:46 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/AlwanBKZ07.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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