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"Prediction of dielectric reliability from I-V characteristics: ..."
K.-H. Allers (2004)
- K.-H. Allers:
Prediction of dielectric reliability from I-V characteristics: Poole-Frenkel conduction mechanism leading to sqrt(E) model for silicon nitride MIM capacitor. Microelectron. Reliab. 44(3): 411-423 (2004)
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