Stop the war!
Остановите войну!
for scientists:
default search action
"Characteristics degradation of the SiGe HBT under electromagnetic field ..."
A. Alaeddine et al. (2010)
- A. Alaeddine, M. Kadi, K. Daoud, B. Beydoun:
Characteristics degradation of the SiGe HBT under electromagnetic field stress. Microelectron. Reliab. 50(12): 1961-1966 (2010)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.