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"Non Contact Surface Potential Measurements for Charging Reduction During ..."
Jan Ackaert et al. (2001)
- Jan Ackaert, Zhichun Wang, Eddy De Backer, P. Colson, Peter Coppens:
Non Contact Surface Potential Measurements for Charging Reduction During Manufacturing of Metal-Insulator-Metal Capacitors. Microelectron. Reliab. 41(9-10): 1403-1407 (2001)
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