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"Modelling of the shoot-through phenomenon introduced by the next ..."
Seiya Abe et al. (2017)
- Seiya Abe
, Kazunori Hasegawa, Masanori Tsukuda, Keiji Wada
, Ichiro Omura, Tamotsu Ninomiya:
Modelling of the shoot-through phenomenon introduced by the next generation IGBT in inverter applications. Microelectron. Reliab. 76-77: 465-469 (2017)
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