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"Operation of SiC normally-off JFET at the edges of its safe operating area."

Carmine Abbate, Giovanni Busatto, Francesco Iannuzzo (2011)

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DOI: 10.1016/J.MICROREL.2011.07.055

access: closed

type: Journal Article

metadata version: 2020-02-22

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Carmine Abbate, Giovanni Busatto, Francesco Iannuzzo:
Operation of SiC normally-off JFET at the edges of its safe operating area. Microelectron. Reliab. 51(9-11): 1767-1772 (2011)

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