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"Thermal damage in SiC Schottky diodes induced by SE heavy ions."

Carmine Abbate et al. (2014)

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DOI: 10.1016/J.MICROREL.2014.07.081

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - journals/mr/AbbateBCDGISV14
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  - https://dblp.org/rec/journals/mr/AbbateBCDGISV14
Carmine Abbate, Giovanni Busatto, Paolo Cova, Nicola Delmonte, Francesco Giuliani, Francesco Iannuzzo, Annunziata Sanseverino, Francesco Velardi:
Thermal damage in SiC Schottky diodes induced by SE heavy ions. Microelectron. Reliab. 54(9-10): 2200-2206 (2014)

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