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"Asymptotic Characterization of Localized Defect Modes: ..."

Richard V. Craster, Bryn Davies (2023)

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DOI: 10.1137/22M1511217

access: closed

type: Journal Article

metadata version: 2024-03-22

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Richard V. Craster, Bryn Davies:
Asymptotic Characterization of Localized Defect Modes: Su-Schrieffer-Heeger and Related Models. Multiscale Model. Simul. 21(3): 827-848 (2023)

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