"Machine learning for neutron reflectometry data analysis of two-layer thin ..."

Mathieu Doucet, Richard K. Archibald, William T. Heller (2021)

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DOI: 10.1088/2632-2153/ABF257

access: open

type: Journal Article

metadata version: 2022-01-03

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Mathieu Doucet, Richard K. Archibald, William T. Heller:
Machine learning for neutron reflectometry data analysis of two-layer thin films. Mach. Learn. Sci. Technol. 2(3): 35001 (2021)

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