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"Noise behavior of vertical tunnel FETs under the influence of interface ..."

Vandana Devi Wangkheirakpam, Brinda Bhowmick, Puspa Devi Pukhrambam (2021)

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DOI: 10.1016/J.MEJO.2021.105124

access: closed

type: Journal Article

metadata version: 2023-09-30

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Vandana Devi Wangkheirakpam, Brinda Bhowmick, Puspa Devi Pukhrambam:
Noise behavior of vertical tunnel FETs under the influence of interface trap states. Microelectron. J. 114: 105124 (2021)

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